Sic Diodes Mosfet Vds 700V RDS 340mΩ Lower Cost Less Than 1/5 GaN Mosfet

Sic Diodes Mosfet Vds 700V RDS 340mΩ Lower Cost Less Than 1/5 GaN Mosfet

US$0.20 660 Pieces (MOQ)

Basic Info.

Model NO.
OSS65R340JF PDFN 8X8-L
Carrying Way
Universal Split
Charging Type
Electric
Applicable Models
Mobile Phone
Cell Type
Li-Polymer
Display
Without Display
LED Lighting
LED Lighting
Certification
RoHS
Socket Type
for USA/Canada
Recyclable
Recyclable
Description
Extremely Low Switching Loss
Characteristics
Excellent Stability and Uniformity
Applications
PC Power
Industries
LED Lighting
Transport Package
Air
Trademark
Orientalsemiconductor
Origin
China
HS Code
854129000
Production Capacity
20kkkk/Monthly

Product Description

General Description
The GreenMOS® high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge. It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The GreenMOS® SuperSi series is based on Oriental Semiconductor's unique device design to achieve extremely fast switching characteristics. It is the perfect replacement for the Gallium Nitride (GaN) device in high frequency operations with better ruggedness and cost. It is targeted to meet the most aggressive efficiency standards of power supply systems by pushing both performance and power density to extreme limits.
Features Low RDS(ON) & FOM Extremely low switching loss Excellent stability and uniformity Easy to design in
Applications PD charger Large screen display Telecom power Server power
Key Performance Parameters
Parameter Value Unit
VDS, min @ Tj(max) 700 V
ID, pulse 36 A
RDS(ON), max @ VGS=10V 340
Qg 9.6 nC

Marking Information
Product Name Package Marking
OSS65R340JF PDFN8×8 OSS65R340J

Absolute Maximum Ratings at Tj=25°C unless otherwise noted
Parameter Symbol Value Unit
Drain-source voltage VDS 650 V
Gate-source voltage VGS ±30 V
Continuous drain current1), TC=25 °C
ID
12
A
Continuous drain current1), TC=100 °C 7.6
Pulsed drain current2), TC=25 °C ID, pulse 36 A
Continuous diode forward current1), TC=25 °C IS 12 A
Diode pulsed current2), TC=25 °C IS, pulse 36 A
Power dissipation3), TC=25 °C PD 83 W
Single pulsed avalanche energy5) EAS 200 mJ
MOSFET dv/dt ruggedness, VDS=0…480 V dv/dt 50 V/ns
Reverse diode dv/dt, VDS=0…480 V, ISD≤ID dv/dt 15 V/ns
Operation and storage temperature Tstg, Tj -55 to 150 °C

Thermal Characteristics
Parameter Symbol Value Unit
Thermal resistance, junction-case RθJC 1.5 °C/W
Thermal resistance, junction-ambient4) RθJA 62 °C/W

Electrical Characteristics at Tj=25°C unless otherwise specified
Parameter Symbol Min. Typ. Max. Unit Test condition

Drain-source breakdown voltage

BVDSS
650
V
VGS=0 V, ID=250 μA
700 VGS=0 V, ID=250 μA, Tj=150 °C
Gate threshold voltage VGS(th) 2.9 3.9 V VDS=VGS, ID=250 μA

Drain-source on- state resistance

RDS(ON)
0.30 0.34
Ω
VGS=10 V, ID=6 A
0.73 VGS=10 V, ID=6 A, Tj=150 °C
Gate-source leakage current
IGSS
100
nA
VGS=30 V
-100 VGS=-30 V
Drain-source leakage current IDSS 1 μA VDS=650 V, VGS=0 V

Dynamic Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Input capacitance Ciss 443.5 pF
VGS=0 V, VDS=50 V, ƒ=100 KHz
Output capacitance Coss 59.6 pF
Reverse transfer capacitance Crss 1.7 pF
Turn-on delay time td(on) 22.4 ns
VGS=10 V, VDS=400 V, RG=2 Ω, ID=6 A
Rise time tr 17.5 ns
Turn-off delay time td(off) 40.3 ns
Fall time tf 7.2 ns

Gate Charge Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Total gate charge Qg 9.6 nC
VGS=10 V, VDS=400 V, ID=6 A
Gate-source charge Qgs 2.2 nC
Gate-drain charge Qgd 4.5 nC
Gate plateau voltage Vplateau 6.5 V

Body Diode Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Diode forward voltage VSD 1.3 V IS=12 A, VGS=0 V
Reverse recovery time trr 236.5 ns
VR=400 V, IS=6 A,
di/dt=100 A/μs
Reverse recovery charge Qrr 2.2 μC
Peak reverse recovery current Irrm 19.1 A

Note Calculated continuous current based on maximum allowable junction temperature. Repetitive rating; pulse width limited by max. junction temperature. Pd is based on max. junction temperature, using junction-case thermal resistance. The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with Ta=25 °C. VDD=100 V, VGS=10 V, L=60 mH, starting Tj=25 °C.
Test circuits and waveforms
Figure 1. Gate charge test circuit & waveform
Figure 2. Switching time test circuit & waveforms
Figure 3. Unclamped inductive switching (UIS) test circuit & waveforms
Figure 4. Diode reverse recovery test circuit & waveforms
Symbol mm
Min Nom Max
A 0.90 1.00 1.10
b 0.90 1.00 1.10
b1 0.00 0.02 0.05
C 0.2REF
D 7.90 8.00 8.10
D1 7.10 7.20 7.30
E 7.90 8.00 8.10
E1 4.65 4.75 4.85
E2 2.65 2.75 2.85
E3 0.30 0.40 0.50
e 2.0BSC
L 0.40 0.50 0.60

Version 1: PDFN8×8-L package outline dimension

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